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1 Ergebnisse
1
Design of SRAM Resilient Against Dynamic Voltage Variations:
, In:
VLSI Design and Test for Systems Dependability
,
Yoshimoto, Masahiko
;
Nakata, Yohei
;
Kimi, Yuta
... - p. 579-591 , 2018
Link:
https://doi.org/10.1007/978-4-431-56594-9_17
RT T1
VLSI Design and Test for Systems Dependability
: T1
Design of SRAM Resilient Against Dynamic Voltage Variations
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-4-431-56594-9_17&Exemplar=1&LAN=DE A1 Yoshimoto, Masahiko A1 Nakata, Yohei A1 Kimi, Yuta A1 Kawaguchi, Hiroshi A1 Nagata, Makoto A1 Nii, Koji PB Springer Japan YR 2018 SP 579 OP 591 LK http://dx.doi.org/https://doi.org/10.1007/978-4-431-56594-9_17 DO https://doi.org/10.1007/978-4-431-56594-9_17 SF ELIB - SuUB Bremen
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