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Deep Learning-Based Smart Attendance Monitoring System:

, In: Advances in Intelligent Systems and Computing; Proceedings of the Global AI Congress 2019,
Halder, Rohit ; Chatterjee, Rajdeep ; Sanyal, Debarshi Kumar. - p. 101-115 , 2020
Link: https://doi.org/10.1007/978-981-15-2188-1_9