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BAT Framework Modeling of Gate First HKMG Si Channel MOSFET:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Parihar, Narendra ; Goel, Nilesh.. - p. 127-149 , 2021
Link: https://doi.org/10.1007/978-981-16-6120-4_7