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1 Ergebnisse
1
Research on Accelerated Aging Test and Junction Temperature..:
, In:
Proceedings of the 5th International Conference on Electrical Engineering and Information Technologies for Rail Transportation (EITRT) 2021; Lecture Notes in Electrical Engineering
,
Sha, Yanbei
;
Pan, Guangze
;
Guo, Mengxue
.. - p. 120-126 , 2022
Link:
https://doi.org/10.1007/978-981-16-9905-4_14
RT T1 <cTitle>Proceedings of the 5th International Conference on Electrical Engineering and Information Technologies for Rail Transportation (EITRT) 2021; Lecture Notes in Electrical Engineering</cTitle>: T1 <Title>Research on Accelerated Aging Test and Junction Temperature Detection Method of IGBT</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-981-16-9905-4_14&Exemplar=1&LAN=DE A1 Sha, Yanbei A1 Pan, Guangze A1 Guo, Mengxue A1 Wei, Lu A1 Peng, Yang PB Springer Singapore YR 2022 SP 120 OP 126 LK http://dx.doi.org/https://doi.org/10.1007/978-981-16-9905-4_14 DO https://doi.org/10.1007/978-981-16-9905-4_14 SF ELIB - SuUB Bremen
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