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1 Ergebnisse
1
Reliability Analysis of the VPX Connector Under the Maximum..:
, In:
Proceedings of the Eighth Asia International Symposium on Mechatronics; Lecture Notes in Electrical Engineering
,
Zhang, Liangjuan
;
Liu, Jiahua
;
Huang, Cheng
- p. 1741-1752 , 2022
Link:
https://doi.org/10.1007/978-981-19-1309-9_167
RT T1
Proceedings of the Eighth Asia International Symposium on Mechatronics; Lecture Notes in Electrical Engineering
: T1
Reliability Analysis of the VPX Connector Under the Maximum Mating Size
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-981-19-1309-9_167&Exemplar=1&LAN=DE A1 Zhang, Liangjuan A1 Liu, Jiahua A1 Huang, Cheng PB Springer Nature Singapore YR 2022 SP 1741 OP 1752 LK http://dx.doi.org/https://doi.org/10.1007/978-981-19-1309-9_167 DO https://doi.org/10.1007/978-981-19-1309-9_167 SF ELIB - SuUB Bremen
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