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Detection of Crack Defect Covers All Section Mutation Posit..:

, In: Proceedings of the Eighth Asia International Symposium on Mechatronics; Lecture Notes in Electrical Engineering,
Zheng, Chong ; Zhou, Shiyuan ; Wang, Jianchao.. - p. 1977-1988 , 2022
Link: https://doi.org/10.1007/978-981-19-1309-9_187