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1 Ergebnisse
1
Statistical Variation Aware Leakage and Total Power Estimat..:
, In:
Communications in Computer and Information Science; VLSI Design and Test
,
Amuru, Deepthi
;
Zahra, Andleeb
;
Abbas, Zia
- p. 565-578 , 2019
Link:
https://doi.org/10.1007/978-981-32-9767-8_47
RT T1
Communications in Computer and Information Science; VLSI Design and Test
: T1
Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-981-32-9767-8_47&Exemplar=1&LAN=DE A1 Amuru, Deepthi A1 Zahra, Andleeb A1 Abbas, Zia PB Springer Singapore YR 2019 SP 565 OP 578 LK http://dx.doi.org/https://doi.org/10.1007/978-981-32-9767-8_47 DO https://doi.org/10.1007/978-981-32-9767-8_47 SF ELIB - SuUB Bremen
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