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Origin of Hump in Ids for Body-Tied SOI-MOSFET and Its Infl..:

, In: Lecture Notes in Electrical Engineering; Emerging Electronic Devices, Circuits and Systems,
Iizuka, T. ; Miura-Mattausch, M. ; Kikuchihara, H.. - p. 445-453 , 2023
Link: https://doi.org/10.1007/978-981-99-0055-8_37