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1 Ergebnisse
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Application of Deep Learning for Wafer Defect Classificatio..:
, In:
Algorithms for Intelligent Systems; Proceedings of International Joint Conference on Advances in Computational Intelligence
,
Hanh, Nguyen Thi Minh
;
Vi, Tran Duc
- p. 327-339 , 2023
Link:
https://doi.org/10.1007/978-981-99-1435-7_28
RT T1
Algorithms for Intelligent Systems; Proceedings of International Joint Conference on Advances in Computational Intelligence
: T1
Application of Deep Learning for Wafer Defect Classification in Semiconductor Manufacturing
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-981-99-1435-7_28&Exemplar=1&LAN=DE A1 Hanh, Nguyen Thi Minh A1 Vi, Tran Duc PB Springer Nature Singapore YR 2023 SP 327 OP 339 LK http://dx.doi.org/https://doi.org/10.1007/978-981-99-1435-7_28 DO https://doi.org/10.1007/978-981-99-1435-7_28 SF ELIB - SuUB Bremen
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