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Dynamic Spectroscopic Imaging Ellipsometry for Thickness Me..:

, In: Springer Proceedings in Physics; Proceedings of the 7th International Symposium of Space Optical Instruments and Applications,
Zhang, Ruixue ; Wu, Guanhao ; Cong, Qiang... - p. 376-385 , 2023
Link: https://doi.org/10.1007/978-981-99-4098-1_33