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A Classifier of AMOLED-TFT Defect Images Based on a DNN Ens..:

, In: Lecture Notes in Electrical Engineering; Progressive and Integrative Ideas and Applications of Engineering Systems Under the Framework of IOT and AI,
Li, Yi-Hsien ; Cheng, Chi-Cheng - p. 121-133 , 2023
Link: https://doi.org/10.1007/978-981-99-6303-4_10