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Microwave Non-destructive Testing Using K-Medoids Clusterin..:

, In: Proceedings of the 12th International Conference on Robotics, Vision, Signal Processing and Power Applications; Lecture Notes in Electrical Engineering,
Yee, Tan Shin ; Akbar, Muhammad Firdaus ; Ghazali, Nor Azlin.. - p. 333-340 , 2024
Link: https://doi.org/10.1007/978-981-99-9005-4_42