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Approaches for quantitative Auger electron spectroscopy of ..:
Schönborn, A.
;
Bubert, H.
;
te Kaat, E. H.
Fresenius' Journal of Analytical Chemistry. 341 (1991) 3-4 - p. 241-244 , 1991
Link:
https://doi.org/10.1007/bf00321555
RT Journal T1 <Title>Approaches for quantitative Auger electron spectroscopy of silicon after high dose nickel implantation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_bf00321555&Exemplar=1&LAN=DE A1 Schönborn, A. A1 Bubert, H. A1 te Kaat, E. H. PB Springer Science and Business Media LLC YR 1991 SN 0937-0633 SN 1432-1130 JF Fresenius' Journal of Analytical Chemistry VO 341 IS 3-4 SP 241 OP 244 LK http://dx.doi.org/https://doi.org/10.1007/bf00321555 DO https://doi.org/10.1007/bf00321555 SF ELIB - SuUB Bremen
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