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1 Ergebnisse
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Multichip systems trade-off analysis tool:
Sandborn, Peter A.
;
Ghosh, Rajarshi
;
Drake, Ken
...
Journal of Electronic Testing. 5 (1994) 2-3 - p. 207-218 , 1994
Link:
https://doi.org/10.1007/bf00972080
RT Journal T1 <Title>Multichip systems trade-off analysis tool</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_bf00972080&Exemplar=1&LAN=DE A1 Sandborn, Peter A. A1 Ghosh, Rajarshi A1 Drake, Ken A1 Abadir, Magdy A1 Bal, Linda A1 Parikh, Ashish PB Springer Science and Business Media LLC YR 1994 SN 0923-8174 SN 1573-0727 JF Journal of Electronic Testing VO 5 IS 2-3 SP 207 OP 218 LK http://dx.doi.org/https://doi.org/10.1007/bf00972080 DO https://doi.org/10.1007/bf00972080 SF ELIB - SuUB Bremen
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