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Influence of structural defects on 1/f in thin niobium film:
Zlokazov, V. O.
;
Potemkin, V. V.
;
Stepanov, A. V.
.
Radiophysics and Quantum Electronics. 35 (1994) 11-12 - p. 610-613 , 1994
Link:
https://doi.org/10.1007/bf01046656
RT Journal T1 <Title>Influence of structural defects on 1/f in thin niobium films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_bf01046656&Exemplar=1&LAN=DE A1 Zlokazov, V. O. A1 Potemkin, V. V. A1 Stepanov, A. V. A1 Chikin, D. G. PB Springer Science and Business Media LLC YR 1994 SN 0033-8443 SN 1573-9120 JF Radiophysics and Quantum Electronics VO 35 IS 11-12 SP 610 OP 613 LK http://dx.doi.org/https://doi.org/10.1007/bf01046656 DO https://doi.org/10.1007/bf01046656 SF ELIB - SuUB Bremen
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