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Reinterpretation of thickness-dependent conductivity of thi..:
Messaadi, S.
;
Pichard, C.
;
Tosser, A. J.
Journal of Materials Science Letters. 5 (1986) 9 - p. 873-875 , 1986
Link:
https://doi.org/10.1007/bf01729256
RT Journal T1 <Title>Reinterpretation of thickness-dependent conductivity of thin platinum films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_bf01729256&Exemplar=1&LAN=DE A1 Messaadi, S. A1 Pichard, C. A1 Tosser, A. J. PB Springer Science and Business Media LLC YR 1986 SN 0261-8028 SN 1573-4811 JF Journal of Materials Science Letters VO 5 IS 9 SP 873 OP 875 LK http://dx.doi.org/https://doi.org/10.1007/bf01729256 DO https://doi.org/10.1007/bf01729256 SF ELIB - SuUB Bremen
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