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The barrier characteristics on silicon of Tixw1-x films of ..:
Jianwen, Lai
;
Hongfang, Pan
Journal of Electronic Materials. 16 (1987) 3 - p. 195-197 , 1987
Link:
https://doi.org/10.1007/bf02655486
RT Journal T1 <Title>The barrier characteristics on silicon of Tixw1-x films of different compositions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_bf02655486&Exemplar=1&LAN=DE A1 Jianwen, Lai A1 Hongfang, Pan PB Springer Science and Business Media LLC YR 1987 SN 0361-5235 SN 1543-186X JF Journal of Electronic Materials VO 16 IS 3 SP 195 OP 197 LK http://dx.doi.org/https://doi.org/10.1007/bf02655486 DO https://doi.org/10.1007/bf02655486 SF ELIB - SuUB Bremen
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