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1 Ergebnisse
1
Effect of hydrogen annealing on hot-carrier instability of ..:
Hsu, C. C. H.
;
Wang, L. K.
;
Zicherman, D.
.
Journal of Electronic Materials. 21 (1992) 7 - p. 769-773 , 1992
Link:
https://doi.org/10.1007/bf02655609
RT Journal T1
Effect of hydrogen annealing on hot-carrier instability of X-Ray irradiated CMOS devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_bf02655609&Exemplar=1&LAN=DE A1 Hsu, C. C. H. A1 Wang, L. K. A1 Zicherman, D. A1 Acovic, A. PB Springer Science and Business Media LLC YR 1992 SN 0361-5235 SN 1543-186X JF Journal of Electronic Materials VO 21 IS 7 SP 769 OP 773 LK http://dx.doi.org/https://doi.org/10.1007/bf02655609 DO https://doi.org/10.1007/bf02655609 SF ELIB - SuUB Bremen
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