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Scanner path planning with the control of overlap for part ..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lavernhe, Sylvain.
The International Journal of Advanced Manufacturing Technology.  98 (2018)  1-4 - p. 629-643 , 2018
Link: https://doi.org/10.1007/s00170-018-2336-8