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1 Ergebnisse
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On the effect of the measurement error on Shewhart t and EW..:
Nguyen, Huu Du
;
Tran, Kim Phuc
;
Celano, Giovanni
..
The International Journal of Advanced Manufacturing Technology. 107 (2020) 9-10 - p. 4317-4332 , 2020
Link:
https://doi.org/10.1007/s00170-020-05222-z
RT Journal T1 <Title>On the effect of the measurement error on Shewhart t and EWMA t control charts</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s00170-020-05222-z&Exemplar=1&LAN=DE A1 Nguyen, Huu Du A1 Tran, Kim Phuc A1 Celano, Giovanni A1 Maravelakis, Petros E. A1 Castagliola, Philippe PB Springer Science and Business Media LLC YR 2020 SN 0268-3768 SN 1433-3015 JF The International Journal of Advanced Manufacturing Technology VO 107 IS 9-10 SP 4317 OP 4332 LK http://dx.doi.org/https://doi.org/10.1007/s00170-020-05222-z DO https://doi.org/10.1007/s00170-020-05222-z SF ELIB - SuUB Bremen
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