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Damage detection by recurrence and entropy methods on the b..:

Kecik, Krzysztof ; Ciecielag, Krzysztof ; Zaleski, Kazimierz
The International Journal of Advanced Manufacturing Technology.  111 (2020)  1-2 - p. 549-563 , 2020
Link: https://doi.org/10.1007/s00170-020-06036-9