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A new multiple dependent state sampling plan based on one-s..:

Yen, Ching-Ho ; Chang, Chia-Hao ; Lee, Chun-Chia
The International Journal of Advanced Manufacturing Technology.  126 (2023)  7-8 - p. 3297-3309 , 2023
Link: https://doi.org/10.1007/s00170-023-11310-7