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Qualify a NIR camera to detect thermal deviation during alu..:
Dellarre, Anthony
;
Béraud, Nicolas
;
Tardif, Nicolas
...
The International Journal of Advanced Manufacturing Technology. 127 (2023) 1-2 - p. 625-634 , 2023
Link:
https://doi.org/10.1007/s00170-023-11587-8
RT Journal T1 <Title>Qualify a NIR camera to detect thermal deviation during aluminum WAAM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s00170-023-11587-8&Exemplar=1&LAN=DE A1 Dellarre, Anthony A1 Béraud, Nicolas A1 Tardif, Nicolas A1 Vignat, Frédéric A1 Villeneuve, François A1 Limousin, Maxime PB Springer Science and Business Media LLC YR 2023 SN 0268-3768 SN 1433-3015 JF The International Journal of Advanced Manufacturing Technology VO 127 IS 1-2 SP 625 OP 634 LK http://dx.doi.org/https://doi.org/10.1007/s00170-023-11587-8 DO https://doi.org/10.1007/s00170-023-11587-8 SF ELIB - SuUB Bremen
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