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Research on knowledge graph-driven equipment fault diagnosi..:
Cai, Chang
;
Jiang, Zhengyi
;
Wu, Hui
...
The International Journal of Advanced Manufacturing Technology. 130 (2024) 9-10 - p. 4649-4662 , 2024
Link:
https://doi.org/10.1007/s00170-024-12998-x
RT Journal T1 <Title>Research on knowledge graph-driven equipment fault diagnosis method for intelligent manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s00170-024-12998-x&Exemplar=1&LAN=DE A1 Cai, Chang A1 Jiang, Zhengyi A1 Wu, Hui A1 Wang, Junsheng A1 Liu, Jiawei A1 Song, Lei PB Springer Science and Business Media LLC YR 2024 SN 0268-3768 SN 1433-3015 JF The International Journal of Advanced Manufacturing Technology VO 130 IS 9-10 SP 4649 OP 4662 LK http://dx.doi.org/https://doi.org/10.1007/s00170-024-12998-x DO https://doi.org/10.1007/s00170-024-12998-x SF ELIB - SuUB Bremen
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