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Multi-ion counting-spark source mass spectrometry (MIC-SSMS..:

Jochum, K. P. ; Laue, H.-J. ; Seufert, H. M....
Fresenius' Journal of Analytical Chemistry.  359 (1997)  4-5 - p. 385-389 , 1997
Link: https://doi.org/10.1007/s002160050593