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Vibrational spectroscopy of SiC thin films deposited by exc..:
Hobert, H.
;
Dunken, H.H.
;
Peiter, G.
...
Applied Physics A: Materials Science & Processing. 69 (1999) 1 - p. 69-76 , 1999
Link:
https://doi.org/10.1007/s003390050973
RT Journal T1 <Title>Vibrational spectroscopy of SiC thin films deposited by excimer laser ablation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s003390050973&Exemplar=1&LAN=DE A1 Hobert, H. A1 Dunken, H.H. A1 Peiter, G. A1 Stier, W. A1 Diegel, M. A1 Stafast, H. PB Springer Science and Business Media LLC YR 1999 SN 0947-8396 SN 1432-0630 JF Applied Physics A: Materials Science & Processing VO 69 IS 1 SP 69 OP 76 LK http://dx.doi.org/https://doi.org/10.1007/s003390050973 DO https://doi.org/10.1007/s003390050973 SF ELIB - SuUB Bremen
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