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1 Ergebnisse
1
Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene:
Lamedschwandner, K.
;
Deutschmann, B.
;
Winkler, G.
.
e & i Elektrotechnik und Informationstechnik. 123 (2006) 1-2 - p. 9-14 , 2006
Link:
https://doi.org/10.1007/s00502-006-0306
RT Journal T1 <Title>Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s00502-006-0306&Exemplar=1&LAN=DE A1 Lamedschwandner, K. A1 Deutschmann, B. A1 Winkler, G. A1 Ostermann, T. PB Springer Science and Business Media LLC YR 2006 SN 0932-383X SN 1613-7620 JF e & i Elektrotechnik und Informationstechnik VO 123 IS 1-2 SP 9 OP 14 LK http://dx.doi.org/https://doi.org/10.1007/s00502-006-0306 DO https://doi.org/10.1007/s00502-006-0306 SF ELIB - SuUB Bremen
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