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Ante-mortem analysis, electrical, thermal, and ageing testi..:

Popp, Hartmut ; Zhang, Ningxin ; Jahn, Marcus...
e & i Elektrotechnik und Informationstechnik.  137 (2020)  4-5 - p. 169-176 , 2020
Link: https://doi.org/10.1007/s00502-020-00814-9