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1 Ergebnisse
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Temperature-Induced Reversible Change of Electrical Resisti..:
Li, Xian-Fen
;
Hu, Cheng-Ming
;
Zu, Fang-Qiu
..
International Journal of Thermophysics. 30 (2009) 3 - p. 1040-1047 , 2009
Link:
https://doi.org/10.1007/s10765-009-0612-4
RT Journal T1 <Title>Temperature-Induced Reversible Change of Electrical Resistivity in Sn–Bi Melts</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10765-009-0612-4&Exemplar=1&LAN=DE A1 Li, Xian-Fen A1 Hu, Cheng-Ming A1 Zu, Fang-Qiu A1 Huang, Zhong-Yue A1 Liu, Ming-Quan PB Springer Science and Business Media LLC YR 2009 SN 0195-928X SN 1572-9567 JF International Journal of Thermophysics VO 30 IS 3 SP 1040 OP 1047 LK http://dx.doi.org/https://doi.org/10.1007/s10765-009-0612-4 DO https://doi.org/10.1007/s10765-009-0612-4 SF ELIB - SuUB Bremen
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