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1 Ergebnisse
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Comparing defect characterization techniques with non-radia..:
Garetto, Davide
;
Randriamihaja, Yoann Mamy
;
Rideau, Denis
..
Journal of Computational Electronics. 11 (2012) 3 - p. 225-237 , 2012
Link:
https://doi.org/10.1007/s10825-012-0413-z
RT Journal T1
Comparing defect characterization techniques with non-radiative multiphonon charge trapping model: AC analysis, trap-assisted-tunneling and charge pumping
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10825-012-0413-z&Exemplar=1&LAN=DE A1 Garetto, Davide A1 Randriamihaja, Yoann Mamy A1 Rideau, Denis A1 Schmid, Alexandre A1 Jaouen, Hervé PB Springer Science and Business Media LLC YR 2012 SN 1569-8025 SN 1572-8137 JF Journal of Computational Electronics VO 11 IS 3 SP 225 OP 237 LK http://dx.doi.org/https://doi.org/10.1007/s10825-012-0413-z DO https://doi.org/10.1007/s10825-012-0413-z SF ELIB - SuUB Bremen
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