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1 Ergebnisse
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Modeling of gate leakage in cylindrical gate-all-around tra..:
Solanki, Ravi
;
Minase, Saniya
;
Mahajan, Ashutosh
.
Journal of Computational Electronics. 20 (2021) 5 - p. 1694-1701 , 2021
Link:
https://doi.org/10.1007/s10825-021-01766-9
RT Journal T1
Modeling of gate leakage in cylindrical gate-all-around transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10825-021-01766-9&Exemplar=1&LAN=DE A1 Solanki, Ravi A1 Minase, Saniya A1 Mahajan, Ashutosh A1 Patrikar, Rajendra PB Springer Science and Business Media LLC YR 2021 SN 1569-8025 SN 1572-8137 JF Journal of Computational Electronics VO 20 IS 5 SP 1694 OP 1701 LK http://dx.doi.org/https://doi.org/10.1007/s10825-021-01766-9 DO https://doi.org/10.1007/s10825-021-01766-9 SF ELIB - SuUB Bremen
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