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Test Technology Newsletter - December 2007: The Newsletter ..:
Kim, Bruce
Journal of Electronic Testing. 23 (2007) 6 - p. 467-468 , 2007
Link:
https://doi.org/10.1007/s10836-007-5058-7
RT Journal T1 <Title>Test Technology Newsletter - December 2007: The Newsletter of the Test Technology Technical Council of the IEEE Computer Society</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10836-007-5058-7&Exemplar=1&LAN=DE A1 Kim, Bruce PB Springer Science and Business Media LLC YR 2007 SN 0923-8174 SN 1573-0727 JF Journal of Electronic Testing VO 23 IS 6 SP 467 OP 468 LK http://dx.doi.org/https://doi.org/10.1007/s10836-007-5058-7 DO https://doi.org/10.1007/s10836-007-5058-7 SF ELIB - SuUB Bremen
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