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1 Ergebnisse
1
Guest Editorial:
Touba, Nur
;
Salsano, Adelio
;
Choi, Minsu
Journal of Electronic Testing. 24 (2008) 1-3 - p. 9-10 , 2008
Link:
https://doi.org/10.1007/s10836-008-5067-1
RT Journal T1 <Title>Guest Editorial</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10836-008-5067-1&Exemplar=1&LAN=DE A1 Touba, Nur A1 Salsano, Adelio A1 Choi, Minsu PB Springer Science and Business Media LLC YR 2008 SN 0923-8174 SN 1573-0727 JF Journal of Electronic Testing VO 24 IS 1-3 SP 9 OP 10 LK http://dx.doi.org/https://doi.org/10.1007/s10836-008-5067-1 DO https://doi.org/10.1007/s10836-008-5067-1 SF ELIB - SuUB Bremen
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