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A New Approach to Model the Effect of Topology on Testing U..:
Fotovatikhah, Farnaz
;
Naraghi, Bahareh
;
Tavakoli, Fatemeh
.
Journal of Electronic Testing. 31 (2015) 3 - p. 301-310 , 2015
Link:
https://doi.org/10.1007/s10836-015-5530-8
RT Journal T1
A New Approach to Model the Effect of Topology on Testing Using Boundary Scan
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10836-015-5530-8&Exemplar=1&LAN=DE A1 Fotovatikhah, Farnaz A1 Naraghi, Bahareh A1 Tavakoli, Fatemeh A1 Ghadiry, Mahdiar PB Springer Science and Business Media LLC YR 2015 SN 0923-8174 SN 1573-0727 JF Journal of Electronic Testing VO 31 IS 3 SP 301 OP 310 LK http://dx.doi.org/https://doi.org/10.1007/s10836-015-5530-8 DO https://doi.org/10.1007/s10836-015-5530-8 SF ELIB - SuUB Bremen
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