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Understanding of scanning-system distortions of atomic-scal..:
Fujinaka, Syota
;
Sato, Yukio
;
Teranishi, Ryo
.
Journal of Materials Science. 55 (2020) 19 - p. 8123-8133 , 2020
Link:
https://doi.org/10.1007/s10853-020-04602-w
RT Journal T1
Understanding of scanning-system distortions of atomic-scale scanning transmission electron microscopy images for accurate lattice parameter measurements
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10853-020-04602-w&Exemplar=1&LAN=DE A1 Fujinaka, Syota A1 Sato, Yukio A1 Teranishi, Ryo A1 Kaneko, Kenji PB Springer Science and Business Media LLC YR 2020 SN 0022-2461 SN 1573-4803 JF Journal of Materials Science VO 55 IS 19 SP 8123 OP 8133 LK http://dx.doi.org/https://doi.org/10.1007/s10853-020-04602-w DO https://doi.org/10.1007/s10853-020-04602-w SF ELIB - SuUB Bremen
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