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Detection of the interlayer at the GaAs-on-InGaP interface ..:
Frigeri, C.
;
Attolini, G.
;
Bosi, M.
..
Journal of Materials Science: Materials in Electronics. 19 (2008) S1 - p. 107-110 , 2008
Link:
https://doi.org/10.1007/s10854-007-9556-2
RT Journal T1 <Title>Detection of the interlayer at the GaAs-on-InGaP interface in MOVPE InGaP/GaAs by the dark field method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-007-9556-2&Exemplar=1&LAN=DE A1 Frigeri, C. A1 Attolini, G. A1 Bosi, M. A1 Pelosi, C. A1 Germini, F. PB Springer Science and Business Media LLC YR 2008 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 19 IS S1 SP 107 OP 110 LK http://dx.doi.org/https://doi.org/10.1007/s10854-007-9556-2 DO https://doi.org/10.1007/s10854-007-9556-2 SF ELIB - SuUB Bremen
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