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On the characterisation of grown-in defects in Czochralski-..:

Vanhellemont, J. ; Van Steenbergen, J. ; Holsteyns, F....
Journal of Materials Science: Materials in Electronics.  19 (2008)  S1 - p. 24-31 , 2008
Link: https://doi.org/10.1007/s10854-008-9579-3