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1 Ergebnisse
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Measurements of dielectric properties of TiO2 thin films at..:
Sheen, Jyh
;
Li, Chueh-Yu
;
Ji, Liang-Wen
...
Journal of Materials Science: Materials in Electronics. 21 (2009) 8 - p. 817-821 , 2009
Link:
https://doi.org/10.1007/s10854-009-9999-8
RT Journal T1 <Title>Measurements of dielectric properties of TiO2 thin films at microwave frequencies using an extended cavity perturbation technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-009-9999-8&Exemplar=1&LAN=DE A1 Sheen, Jyh A1 Li, Chueh-Yu A1 Ji, Liang-Wen A1 Mao, Wei-Lung A1 Liu, Weihsing A1 Chen, Chin-An PB Springer Science and Business Media LLC YR 2009 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 21 IS 8 SP 817 OP 821 LK http://dx.doi.org/https://doi.org/10.1007/s10854-009-9999-8 DO https://doi.org/10.1007/s10854-009-9999-8 SF ELIB - SuUB Bremen
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