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1 Ergebnisse
1
Failure analysis of EOS-induced damage at final electrical ..:
Chen, Ming-Kun
;
Huang, Yu-Jung
;
Cheng, Chi-Chan
..
Journal of Materials Science: Materials in Electronics. 25 (2013) 2 - p. 596-603 , 2013
Link:
https://doi.org/10.1007/s10854-013-1521-7
RT Journal T1 <Title>Failure analysis of EOS-induced damage at final electrical testing</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-013-1521-7&Exemplar=1&LAN=DE A1 Chen, Ming-Kun A1 Huang, Yu-Jung A1 Cheng, Chi-Chan A1 Lin, Yi-Lung A1 Fu, Shen-Li PB Springer Science and Business Media LLC YR 2013 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 25 IS 2 SP 596 OP 603 LK http://dx.doi.org/https://doi.org/10.1007/s10854-013-1521-7 DO https://doi.org/10.1007/s10854-013-1521-7 SF ELIB - SuUB Bremen
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