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Influence of RF power on structural optical and electrical ..:
Jadhavar, Ashok
;
Pawbake, Amit
;
Waykar, Ravindra
...
Journal of Materials Science: Materials in Electronics. 27 (2016) 12 - p. 12365-12373 , 2016
Link:
https://doi.org/10.1007/s10854-016-5024-1
RT Journal T1 <Title>Influence of RF power on structural optical and electrical properties of hydrogenated nano-crystalline silicon (nc-Si:H) thin films deposited by PE-CVD</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-016-5024-1&Exemplar=1&LAN=DE A1 Jadhavar, Ashok A1 Pawbake, Amit A1 Waykar, Ravindra A1 Waman, Vaishali A1 Rondiya, Sachin A1 Shinde, Omkar A1 Kulkarni, Rupali A1 Rokade, Avinash A1 Bhorde, Ajinkya A1 Funde, Adinath A1 Patil, Dinkar A1 Pathan, Habib A1 Jadkar, Sandesh PB Springer Science and Business Media LLC YR 2016 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 27 IS 12 SP 12365 OP 12373 LK http://dx.doi.org/https://doi.org/10.1007/s10854-016-5024-1 DO https://doi.org/10.1007/s10854-016-5024-1 SF ELIB - SuUB Bremen
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