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Dielectric relaxations in Ba0.85Sr0.15TiO3 thin films depos..:
Selmi, A.
;
Khaldi, O.
;
Mascot, M.
..
Journal of Materials Science: Materials in Electronics. 27 (2016) 11 - p. 11299-11307 , 2016
Link:
https://doi.org/10.1007/s10854-016-5253-3
RT Journal T1 <Title>Dielectric relaxations in Ba0.85Sr0.15TiO3 thin films deposited on Pt/Ti/SiO2/Si substrates by sol–gel method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-016-5253-3&Exemplar=1&LAN=DE A1 Selmi, A. A1 Khaldi, O. A1 Mascot, M. A1 Jomni, F. A1 Carru, J. C. PB Springer Science and Business Media LLC YR 2016 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 27 IS 11 SP 11299 OP 11307 LK http://dx.doi.org/https://doi.org/10.1007/s10854-016-5253-3 DO https://doi.org/10.1007/s10854-016-5253-3 SF ELIB - SuUB Bremen
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