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Usage of electron back scattering diffraction for investiga..:
Sorokin, B. P.
;
Bormashov, V. S.
;
Korostilev, E. V.
...
Journal of Materials Science: Materials in Electronics. 28 (2017) 18 - p. 13464-13471 , 2017
Link:
https://doi.org/10.1007/s10854-017-7185-y
RT Journal T1 <Title>Usage of electron back scattering diffraction for investigation of buried damage layer underneath a single crystalline diamond surface</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-017-7185-y&Exemplar=1&LAN=DE A1 Sorokin, B. P. A1 Bormashov, V. S. A1 Korostilev, E. V. A1 Novoselov, A. S. A1 Doronin, M. A. A1 Kravchuk, K. S. A1 Blank, V. D. PB Springer Science and Business Media LLC YR 2017 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 28 IS 18 SP 13464 OP 13471 LK http://dx.doi.org/https://doi.org/10.1007/s10854-017-7185-y DO https://doi.org/10.1007/s10854-017-7185-y SF ELIB - SuUB Bremen
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