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Correlation of residual stress variations to electrical pro..:
Chan y Díaz, E.
;
Castro-Rodríguez, R.
;
Perez-Quintana, I.
...
Journal of Materials Science: Materials in Electronics. 28 (2017) 19 - p. 14685-14688 , 2017
Link:
https://doi.org/10.1007/s10854-017-7334-3
RT Journal T1 <Title>Correlation of residual stress variations to electrical properties changes in ZNO thin films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-017-7334-3&Exemplar=1&LAN=DE A1 Chan y Díaz, E. A1 Castro-Rodríguez, R. A1 Perez-Quintana, I. A1 Acosta, M. A1 Méndez-Gamboa, J. A1 Medina-Esquivel, R. A. A1 Acosta, C. A1 Iribarren, A. PB Springer Science and Business Media LLC YR 2017 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 28 IS 19 SP 14685 OP 14688 LK http://dx.doi.org/https://doi.org/10.1007/s10854-017-7334-3 DO https://doi.org/10.1007/s10854-017-7334-3 SF ELIB - SuUB Bremen
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