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X-ray induced Sm-ion valence conversion in Sm-ion implanted..:
Chicilo, Farley
;
Koughia, Cyril
;
Curry, Richard
...
Journal of Materials Science: Materials in Electronics. 30 (2019) 18 - p. 16740-16746 , 2019
Link:
https://doi.org/10.1007/s10854-019-01212-4
RT Journal T1 <Title>X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-019-01212-4&Exemplar=1&LAN=DE A1 Chicilo, Farley A1 Koughia, Cyril A1 Curry, Richard A1 Gwilliam, Russel A1 Ahumada-Lazo, Ruben A1 Edgar, Andy A1 Binks, David J. A1 Chapman, Dean A1 Kasap, Safa PB Springer Science and Business Media LLC YR 2019 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 30 IS 18 SP 16740 OP 16746 LK http://dx.doi.org/https://doi.org/10.1007/s10854-019-01212-4 DO https://doi.org/10.1007/s10854-019-01212-4 SF ELIB - SuUB Bremen
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