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Nickel ion beam induced modifications in Cu–Se heterojuncti..:
Panchal, Suresh
;
Chauhan, R. P.
Journal of Materials Science: Materials in Electronics. 31 (2019) 1 - p. 693-703 , 2019
Link:
https://doi.org/10.1007/s10854-019-02577-2
RT Journal T1 <Title>Nickel ion beam induced modifications in Cu–Se heterojunction nanowires</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-019-02577-2&Exemplar=1&LAN=DE A1 Panchal, Suresh A1 Chauhan, R. P. PB Springer Science and Business Media LLC YR 2019 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 31 IS 1 SP 693 OP 703 LK http://dx.doi.org/https://doi.org/10.1007/s10854-019-02577-2 DO https://doi.org/10.1007/s10854-019-02577-2 SF ELIB - SuUB Bremen
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