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Physical investigations on annealed structure Cu/La2O3 for ..:

Bilel, C. ; Jbeli, R. ; Jemaa, I. Ben...
Journal of Materials Science: Materials in Electronics.  31 (2020)  10 - p. 7398-7410 , 2020
Link: https://doi.org/10.1007/s10854-020-02863-4