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1 Ergebnisse
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Temperature dependence of interface state density distribut..:
Duman, S.
;
Ejderha, K.
;
Orak, I.
..
Journal of Materials Science: Materials in Electronics. 31 (2020) 23 - p. 21260-21271 , 2020
Link:
https://doi.org/10.1007/s10854-020-04638-3
RT Journal T1 <Title>Temperature dependence of interface state density distribution determined from conductance–frequency measurements in Ni/n-GaP/Al diode</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-020-04638-3&Exemplar=1&LAN=DE A1 Duman, S. A1 Ejderha, K. A1 Orak, I. A1 Yıldırım, N. A1 Turut, A. PB Springer Science and Business Media LLC YR 2020 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 31 IS 23 SP 21260 OP 21271 LK http://dx.doi.org/https://doi.org/10.1007/s10854-020-04638-3 DO https://doi.org/10.1007/s10854-020-04638-3 SF ELIB - SuUB Bremen
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