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Development of highly reliable BiFeO3/HfO2/Silicon gate sta..:

Tripathi, Pramod Narayan ; Ojha, Sanjeev Kumar ; Nazarov, Alexey
Journal of Materials Science: Materials in Electronics.  31 (2020)  24 - p. 22107-22118 , 2020
Link: https://doi.org/10.1007/s10854-020-04713-9