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1 Ergebnisse
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Argon pressure dependent optoelectronic characteristics of ..:
Ziani, N.
;
Galca, A. C.
;
Belkaid, M. S.
.
Journal of Materials Science: Materials in Electronics. 32 (2021) 9 - p. 12308-12317 , 2021
Link:
https://doi.org/10.1007/s10854-021-05861-2
RT Journal T1 <Title>Argon pressure dependent optoelectronic characteristics of amorphous tin oxide thin films obtained by non-reactive RF sputtering process</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-021-05861-2&Exemplar=1&LAN=DE A1 Ziani, N. A1 Galca, A. C. A1 Belkaid, M. S. A1 Stavarache, I. PB Springer Science and Business Media LLC YR 2021 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 32 IS 9 SP 12308 OP 12317 LK http://dx.doi.org/https://doi.org/10.1007/s10854-021-05861-2 DO https://doi.org/10.1007/s10854-021-05861-2 SF ELIB - SuUB Bremen
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