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1 Ergebnisse
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Study of trapping parameters of MgB4O7: Dy exposed to 75 Me..:
Sharma, Ravi
;
Parauha, Yatish R.
;
Chopra, Vibha
...
Journal of Materials Science: Materials in Electronics. 32 (2021) 17 - p. 22527-22534 , 2021
Link:
https://doi.org/10.1007/s10854-021-06738-0
RT Journal T1 <Title>Study of trapping parameters of MgB4O7: Dy exposed to 75 MeV O6+ ion beam</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_s10854-021-06738-0&Exemplar=1&LAN=DE A1 Sharma, Ravi A1 Parauha, Yatish R. A1 Chopra, Vibha A1 Sharma, Nisha A1 Singh, Birendra A1 Dhoble, S. J. PB Springer Science and Business Media LLC YR 2021 SN 0957-4522 SN 1573-482X JF Journal of Materials Science: Materials in Electronics VO 32 IS 17 SP 22527 OP 22534 LK http://dx.doi.org/https://doi.org/10.1007/s10854-021-06738-0 DO https://doi.org/10.1007/s10854-021-06738-0 SF ELIB - SuUB Bremen
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